Exploring the environmental transmission electron microscope

Micron

Volumn 43, Issue 11, 2012, Pages 1169-1175

  Wagner, Jakob B ^a   Cavalca, Filippo ^a   Damsgaard, Christian D ^a   Duchstein, Linus D L ^a   Hansen, Thomas W ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

In situ environmental TEM

Indexed keywords

ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPES; GASEOUS ENVIRONMENTS; IN-SITU; IN-SITU MEASUREMENT; IN-SITU TECHNIQUES; REALISTIC CONDITIONS; STUDIES OF MATERIALS; TRANSFER METHOD; TRANSMISSION ELECTRON MICROSCOPY TEM;

CELL CULTURE; SEMICONDUCTOR MATERIALS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84864821819     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2012.02.008     Document Type: Article

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