SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 520, Issue 21, 2012, Pages 6576-6580

A map of competing buckling-driven failure modes of substrate-supported thin brittle films

(4) Jia, Zheng a Peng, Cheng b Lou, Jun b Li, Teng a

a UNIVERSITY OF MARYLAND (United States)

b Rice University (United States)

Author keywords

Buckling; Cracking; Delamination; Thin films

Indexed keywords

FILM CRACKING; IN-SITU EXPERIMENTS; INDIUM TIN OXIDE FILMS; INTERFACIAL ADHESIONS; INTERFACIAL DELAMINATION; INTERFACIAL IMPERFECTION; MECHANICAL DURABILITY; PARAMETER SPACES; TRANSPARENT CONDUCTORS;

BUCKLING; CRACK INITIATION; DELAMINATION; INDIUM COMPOUNDS; POLYIMIDES; THIN FILMS; TIN; TIN OXIDES;

FAILURE MODES;

EID: 84864776555 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2012.07.011 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.