Noise and transport characterization of single molecular break junctions with individual molecule

Journal of Applied Physics

Volumn 112, Issue 1, 2012, Pages

  Sydoruk, V A ^a   Xiang, D ^a   Vitusevich, S A ^a   Petrychuk, M V ^b   Vladyka, A ^a   Zhang, Y ^a   Offenhausser A ^a   Kochelap, V A ^c   Belyaev, A E ^c   Mayer, D ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; BREAK JUNCTIONS; CHARACTERISTIC FREQUENCIES; CURRENT AMPLITUDE; CURRENT NOISE; DYNAMIC RE-CONFIGURATION; LOCK-IN; MECHANICALLY CONTROLLABLE BREAK JUNCTIONS; METAL ELECTRODES; MOLECULAR COUPLING; NANO-ELECTRODES; NOISE COMPONENTS; NOISE SPECTRA; ON CURRENTS; PHENOMENOLOGICAL MODELS; SINGLE MOLECULE;

DYNAMIC MODELS; ELECTRODES; NANOELECTRONICS; POWER SPECTRAL DENSITY;

MOLECULES;

EID: 84864140767     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4736558     Document Type: Article

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