Scaling of 1/f noise in tunable break junctions

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 23, 2008, Pages

  Wu, ZhengMing ^a   Wu, SongMei ^a   Oberholzer, S ^a   Steinacher, M ^a   Calame, M ^a   Schonenberger C ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 58149461428     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.235421     Document Type: Article

References (55)

1. P. Bak, C. Tang, and K. Wiesenfeld, Phys. Rev. Lett. 59, 381 (1987). 10.1103/PhysRevLett.59.381
2. A. van der Ziel, Noise (Prentice-Hall, Englewood Cliffs, 1954).
3. Sh. Kogan, Electronic Noise and Fluctuations in Solids (Cambridge University Press, Cambridge, 1996).
4. Ya. M. Blanter and M. Büttiker, Phys. Rep. 336, 1 (2000). 10.1016/S0370-1573(99)00123-4
5. C. Beenakker and C. Schönenberger, Phys. Today 56 (5), 37 (2003). 10.1063/1.1583532
6. J. B. Johnson, Phys. Rev. 32, 97 (1928). 10.1103/PhysRev.32.97
7. H. Nyquist, Phys. Rev. 32, 110 (1928). 10.1103/PhysRev.32.110
8. W. Schottky, Ann. Phys. 362, 541 (1918). 10.1002/andp.19183622304
9. F. N. Hooge, Phys. Lett. 29, 139 (1969). 10.1016/0375-9601(69)90076-0
10. R. F. Voss and J. Clarke, Phys. Rev. B 13, 556 (1976). 10.1103/PhysRevB.13.556
11. D. A. Bell, J. Phys. C 13, 4425 (1980). 10.1088/0022-3719/13/24/007
12. F. N. Hooge, T. G. M. Kleinpenning, and L. K. J. Vandamme, Rep. Prog. Phys. 44, 479 (1981). 10.1088/0034-4885/44/5/001
13. P. Dutta and P. M. Horn, Rev. Mod. Phys. 53, 497 (1981). 10.1103/RevModPhys.53.497
14. M. S. Keshner, Proc. IEEE 70, 212 (1982). 10.1109/PROC.1982.12282
15. D. M. Fleetwood, J. T. Masden, and N. Giordano, Phys. Rev. Lett. 50, 450 (1983). 10.1103/PhysRevLett.50.450
16. N. Giordano, Rev. Solid State Sci. 3, 27 (1989).
17. M. B. Weissman, Rev. Mod. Phys. 60, 537 (1988). 10.1103/RevModPhys.60.537
18. L. K. J. Vandamme, Xiasong Li, and D. Rigaud, IEEE Trans. Electron Devices 41, 1936 (1994). 10.1109/16.333809
19. R. S. Sorbello, in Materials Reliability Issues in Microelectronics, edited by, J. R. Lloyd,,, F. G. Yost,, and, P. S. Ho,, MRS Symposia Proceedings No. 225 (Materials Research Society, Warrendale, 1991), pp. 3-13.
20. L. K. J. Vandamme, IEEE Trans. Electron Devices 41, 2176 (1994). 10.1109/16.333839
21. K. Dagge, W. Frank, A. Seeger, and H. Stoll, Appl. Phys. Lett. 68, 1198 (1996). 10.1063/1.115967
22. J. Dong and B. A. Parviz, Nanotechnology 17, 5124 (2006). 10.1088/0957-4484/17/20/014
23. I. K. Yanson, A. I. Akimenko, and A. B. Verkin, Solid State Commun. 43, 765 (1982). 10.1016/0038-1098(82)90988-7
24. A. I. Akimenko, A. B. Verkin, and I. K. Yanson, J. Low Temp. Phys. 54, 247 (1984). 10.1007/BF00683277
25. K. S. Ralls and R. A. Buhrman, Phys. Rev. B 44, 5800 (1991). 10.1103/PhysRevB.44.5800
26. P. A. M. Holweg, J. Caro, A. H. Verbruggen, and S. Radelaar, Phys. Rev. B 45, 9311 (1992). 10.1103/PhysRevB.45.9311
27. G. Zimmerli, T. M. Eiles, R. L. Kautz, and J. M. Martinis, Appl. Phys. Lett. 61, 237 (1992). 10.1063/1.108195
28. H. Birk, M. J. M. de Jong, and C. Schönenberger, Phys. Rev. Lett. 75, 1610 (1995). 10.1103/PhysRevLett.75.1610
29. F. Liefrink, A. J. Scholten, C. Dekker, J. I. Dijkhuis, B. W. Alphenaar, H. van Houten, and C. T. Foxon, Phys. Rev. B 46, 15523 (1992). 10.1103/PhysRevB.46.15523
30. B. Neri, C. Ciofi, and V. Dattilo, IEEE Trans. Electron Devices 44, 1454 (1997). 10.1109/16.622601
31. A. Bid, A. Bora, and A. K. Raychaudhuri, Phys. Rev. B 72, 113415 (2005). 10.1103/PhysRevB.72.113415
32. N. O. Birge, B. Golding, and W. H. Haemmerle, Phys. Rev. Lett. 62, 195 (1989). 10.1103/PhysRevLett.62.195
33. C. Strunk, M. Henny, C. Schönenberger, G. Neuttiens, and C. Van Haesendonck, Phys. Rev. Lett. 81, 2982 (1998). 10.1103/PhysRevLett.81.2982
34. D. Hoadley, P. McConville, and N. O. Birge, Phys. Rev. B 60, 5617 (1999). 10.1103/PhysRevB.60.5617
35. G. Neuttiens, C. Strunk, C. Van Haesendonck, and Y. Bruynseraede, Phys. Rev. B 62, 3905 (2000). 10.1103/PhysRevB.62.3905
36. P. G. Collins, M. S. Fuhrer, and A. Zettl, Appl. Phys. Lett. 76, 894 (2000). 10.1063/1.125621
37. E. S. Snow, J. P. Novak, M. D. Lay, and F. K. Perkins, Appl. Phys. Lett. 85, 4172 (2004). 10.1063/1.1812838
38. M. Ishigami, J. H. Chen, E. D. Williams, D. Tobias, Y. F. Chen, and M. S. Fuhrer, Appl. Phys. Lett. 88, 203116 (2006). 10.1063/1.2206685
39. E. Onac, F. Balestro, B. Trauzettel, C. F. J. Lodewijk, and L. P. Kouwenhoven, Phys. Rev. Lett. 96, 026803 (2006). 10.1103/PhysRevLett.96.026803
40. R. Möller, A. Esslinger, and B. Koslowski, Appl. Phys. Lett. 55, 2360 (1989). 10.1063/1.102018
41. Xiuguang Jiang, M. A. Dubson, and J. C. Garland, Phys. Rev. B 42, 5427 (1990). 10.1103/PhysRevB.42.5427
42. F. N. Hooge, Physica B 162, 344 (1990). 10.1016/0921-4526(90)90030-X
43. M. Tacano, IEEE Trans. Electron Devices 40, 2060 (1993). 10.1109/16.239749
44. E. P. Vandamme and L. K. J. Vandamme, IEEE Trans. Electron Devices 47, 2146 (2000). 10.1109/16.877177
45. C. T. Sah and F. Hielscher, Phys. Rev. Lett. 17, 956 (1966). 10.1103/PhysRevLett.17.956
46. L. K. J. Vandamme, IEEE Trans. Electron Devices 36, 987 (1989). 10.1109/16.299682
47. H. Wong, Y. C. Chng, and G. Ruan, J. Appl. Phys. 67, 312 (1990). 10.1063/1.345254
48. H. Park, A. K. L. Lim, J. Park, A. P. Alivisatos, and P. L. McEuen, Appl. Phys. Lett. 75, 301 (1999). 10.1063/1.124354
49. J. M. van Ruitenbeek, A. Alvarez, I. Pineyro, C. Grahmann, P. Joyez, M. H. Devoret, D. Esteve, and C. Urbina, Rev. Sci. Instrum. 67, 108 (1996). 10.1063/1.1146558
50. E. Scheer, P. Joyez, D. Esteve, C. Urbina, and M. H. Devoret, Phys. Rev. Lett. 78, 3535 (1997). 10.1103/PhysRevLett.78.3535
51. N. Agrait, A. L. Yeyati, and J. M. van Ruitenbeek, Phys. Rep. 377, 81 (2003). 10.1016/S0370-1573(02)00633-6
52. Zheng Ming Wu, M. Steinacher, R. Huber, M. Calame, S. J. van der Molen, and C. Schönenberger, Appl. Phys. Lett. 91, 053118 (2007). 10.1063/1.2760150
53. L. Grüter, M. T. Gonzalez, R. Huber, M. Calame, and C. Schönenberger, Small 1, 1067 (2005). 10.1002/smll.200500145
54. M. L. Trouwborst, S. J. van der Molen, and B. J. van Wees, J. Appl. Phys. 99, 114316 (2006). 10.1063/1.2203410
55. Y. V. Sharvin, Sov. Phys. JETP 21, 655 (1965).