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Volumn 99, Issue 1, 2011, Pages

Extending the voltage window in the characterization of electrical transport of large-area molecular junctions

Author keywords

[No Author keywords available]

Indexed keywords

BREAK DOWN; DC BIAS; DIFFERENT TRANSPORT MODELS; DUTY CYCLES; ELECTRICAL FIELD; ELECTRICAL TRANSPORT; MOLECULAR JUNCTION; POWER-LAW DEPENDENCES; PULSE MEASUREMENTS; PULSE WIDTH; VOLTAGE WINDOW;

EID: 79960493999     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3608154     Document Type: Article
Times cited : (7)

References (22)
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  • 3
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  • 7
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    • Wang, W.1    Lee, T.2    Reed, M.A.3
  • 10
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    • Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy
    • DOI 10.1021/ja0101532
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  • 21
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    • Simmons, J.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.