A facile tool for the characterization of two-dimensional materials grown by chemical vapor deposition

Nano Research

Volumn 5, Issue 7, 2012, Pages 504-511

  Hofmann, Mario ^a   Shin, Yong Cheol ^b   Hsieh, Ya Ping ^c   Dresselhaus, Mildred S ^d   Kong, Jing ^a  

^a Department of Electrical Engineering and Computer Science   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

analysis; chemical vapor deposition Address; graphene; Two dimensional materials

Indexed keywords

EID: 84864125979     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-012-0227-0     Document Type: Article

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