Electrowetting phenomenon on nanostructured surfaces studied by using atomic force microscopy

Journal of Physical Chemistry C

Volumn 116, Issue 27, 2012, Pages 14311-14317

  Revilla, Reynier I ^a,c   Guan, Li ^a,b   Zhu, Xiao Yang ^a   Quan, Bao Gang ^a   Yang, Yan Lian ^a   Wang, Chen ^a  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

^b RENMIN UNIVERSITY OF CHINA   (China)

^c Centro de Estudios Avanzados de Cuba   (Cuba)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; CONDUCTIVE AFM; DIELECTRIC SURFACE; ELECTRO-WETTING PHENOMENON; ELECTROWETTING; NANOSTRUCTURED SURFACE; SOLID-LIQUID INTERFACES; THIN LAYERS; THREE-PHASE CONTACT LINE; TIO;

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ESTERS; MAGNETIC BUBBLES; NANOPARTICLES; TITANIUM DIOXIDE; WETTING;

DIELECTRIC PROPERTIES;

EID: 84863857116     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp301549p     Document Type: Article

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