Nanoscale electrowetting effects studied by atomic force microscopy

Journal of Physical Chemistry C

Volumn 113, Issue 2, 2009, Pages 661-665

  Guan, Li ^a   Qi, Guicun ^a   Liu, Sheng ^a   Zhang, Hui ^a   Zhang, Zhong ^a   Yang, Yanlian ^a   Wang, Chen ^a  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION CHARACTERISTICS; ADHESIVE INTERACTIONS; AFM; ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; DIELECTRIC SURFACES; ELECTRICAL FIELD STRENGTHS; ELECTROWETTING; EXTERNAL ELECTRIC FIELDS; FORCE SPECTROSCOPIES; FORCE-DISTANCE SPECTROSCOPIES; HIGH STABILITIES; LOW ELECTRICAL FIELDS; NANO-METER SCALE; NANO-SCALE; POLY-METHYL METHACRYLATES; SATURATION EFFECTS;

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; SPECTROSCOPIC ANALYSIS; SURFACE TENSION;

ATOMIC SPECTROSCOPY;

EID: 65249160532     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp806538r     Document Type: Article

References (29)

1. Daub, C. D.; Bratko, D.; Leung, K.; Luzar, A. J. Phys. Chem C 2007, 111, 505.
2. Zhu, L.; Xu, J.; Xiu, Y.; Sun, Y.; Hess, D. W.; Wong, C.-P J. Phys. Chem. B. 2006, 110, 15945.
3. Quinn, A.; Sedev, R.; Ralston, J J. Phys. Chem. B. 2005, 109, 6268.
4. Krupenkin, T. N.; Taylor, J. A.; Schneider, T. M.; Shu, Y. Langmuir 2004, 20, 3824.
5. Bienia, M; Quilliet, C.; Vallade, M. Langmuir 2003, 19, 9328.
6. Kang, K. H. Langmuir 2002, 18, 10318.
7. Decamps, C.; De Coninck, J. Langmuir 2000, 16, 10150.
8. Blake, T. D.; Clarke, A.; Stattersfield, E. H. Langmuir 2000, 16, 2928.
9. Janocha, B.; Bauser, H.; Oehr, C.; Brunner, H.; Gopel, W. Langmuir 2000, 16, 3349.
10. Prins, M. W. J.; Welters, W. J. J.; Weekamp, J. W. Science 2001, 291, 277.
11. Lee, J.; Moon, H.; Flower, J.; Schoellhammmer, T.; Kim, C. J. Sens. Actuators 2002, 95, 259.
12. Quinn, A.; Sedev, R.; Ralston, J. J. Phys. Chem. B. 2003, 107, 1163.
13. Morcos, I. J. Electroanal. Chem. 1975, 62, 313.
14. Beck, T. R. J. Phys. Chem. 1969, 73, 466.
15. Fredlein, R. A.; Damjanovic, A.; Bockris, J. O. M. Surf. Sci. 1971, 25, 261.
16. Christenson, E. M.; Anderson, J. M.; Hiltner, A.; Baer, E. Polymer 2005, 46, 11744.
17. Paige, M. F. Polymer 2003, 44, 6345.
18. Vasilev, C.; Reiter, G.; Pispas, S.; Hadjichristidis, N. Polymer 2006, 47, 330.
19. Ratto, T. V.; Langry, K. C.; Rudd, R. E.; Balhorn, R. L.; Allen, M. J.; McElfresh, M. W Biophys. J. 2004, 86, 2430.
20. Wang, T.; Xu, J.; Qiu, F.; Zhang, H.; Yang, Y. Polymer 2007, 48, 6170.
21. Jacob, N.; Israelachvili, Academic Press 1985, 225.
22. Miyama, M.; Yang, Y.; Yasuda, H. K. Langmuir 1997, 13, 5494.
23. Digilov, R. Langmuir 2000, 16, 6719.
24. Verheijan, H. J. J.; Prins, M. W. J. Langmuir 1999, 15, 6616.
25. Peykov, V.; Quinn, A.; Ralston, J. Colloid Polym. Sci. 2000, 278, 789.
26. Bateni, A.; Laughton, S.; Tavana, H.; Susnar, S. S.; Amirfazli, A; Neumann, A. W. J. Colloid Interface Sci. 2005, 283, 215.
27. Luzar, A.; Svetina, S.; Zeks, B. Chem. Phys. Lett. 1983, 96, 485.
28. Lee, C. Y.; McCammmon, J. A.; Rossky, P. J. J. Chem. Phys. 1984, 80, 4448.
29. Luzar, A.; Svetina, S.; Zeks, B. J. Chem. Phys. 1985, 82, 5146.