Nanoscale electrowetting effects observed by using friction force microscopy

Langmuir

Volumn 27, Issue 12, 2011, Pages 7603-7608

  Revilla, Reynier ^a,b   Guan, Li ^a   Zhu, Xiao Yang ^a   Yang, Yan Lian ^a   Wang, Chen ^a  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

^b Centro de Estudios Avanzados de Cuba   (Cuba)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; CAPILLARY PHENOMENA; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD STRENGTH; ELECTRO WETTING; FRICTION COEFFICIENTS; FRICTION FORCE; FRICTION FORCE MICROSCOPY; FRICTIONAL BEHAVIOR; INTERFACIAL CONTACT; NANO SCALE; NANO-METER SCALE; STRONG ELECTRIC FIELDS;

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ESTERS; TRIBOLOGY; WETTING;

FRICTION;

EID: 79959201544     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la200983y     Document Type: Article

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