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Volumn 185, Issue 5-7, 2012, Pages 140-145
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Elucidation of fluorine in SnO 2:F sprayed films by different spectroscopic techniques
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Author keywords
EPMA; Fluorine doped tin oxide; RBS; SEM; WDXRF; XPS
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Indexed keywords
CLEANED GLASS SUBSTRATES;
DEPOSITION PROCESS;
FLUORINE CONTENT;
FLUORINE DOPED TIN OXIDE;
RBS;
RUTHERFORD BACK-SCATTERING;
SPECTROSCOPIC TECHNIQUE;
SPRAY-PYROLYSIS TECHNIQUES;
WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES;
WDXRF;
DEPOSITION;
DOPING (ADDITIVES);
ELECTRON PROBE MICROANALYSIS;
FILM PREPARATION;
PHOTOELECTRONS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SODIUM SULFATE;
SPRAY PYROLYSIS;
SUBSTRATES;
THIN FILMS;
TIN;
TIN OXIDES;
VAPOR DEPOSITION;
X RAY PHOTOELECTRON SPECTROSCOPY;
FLUORINE;
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EID: 84863706445
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2012.04.004 Document Type: Article |
Times cited : (11)
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References (24)
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