Experimental evidence for secondary excitation in X-ray photoelectron spectrometry

Journal of Electron Spectroscopy and Related Phenomena

Volumn 131-132, Issue , 2003, Pages 145-151

  Ebel, Maria F ^a   Svagera, Robert ^a   Ashury, Reza ^a   Ebel, Horst ^a   Zalm, Peter C ^b   Van der Marel, Cees ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Fundamental parameter approach for X ray analysis; Ghost lines; Secondary excitation in binary alloys; Secondary excitation of layer atoms by substrate radiation; Secondary excitation of photoelectron spectra

Indexed keywords

BINARY ALLOYS; FLUORESCENCE; GOLD; SPECTROMETRY; THIN FILMS;

SECONDARY EXCITATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 16744368254     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(03)00132-4     Document Type: Article

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