Characterisation of SnOx films on architectural glass by neutron reflectometry, SIMS, CEMS and spectrophotometry

Journal of Non-Crystalline Solids

Volumn 218, Issue , 1997, Pages 291-295

  Caccavale, F ^a   Coppola, R ^b   Menelle, A ^c   Montecchi, M ^b   Polato, P ^d   Principi, G ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b ENEA C R CASACCIA   (Italy)

^c CEA SACLAY   (France)

^d STAZIONE SPERIMENTALE DEL VETRO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GLASS; MOLECULAR STRUCTURE; MOSSBAUER SPECTROSCOPY; OPTICAL PROPERTIES; SECONDARY ION MASS SPECTROMETRY; SILICA; SPECTROPHOTOMETRY; STOICHIOMETRY; TIN COMPOUNDS;

CONVERSION ELECTRON MOESSBAUER SPECTROSCOPY (CEMS); NEUTRON REFLECTOMETRY; TIN OXIDES;

OPTICAL COATINGS;

EID: 0031549362     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00203-2     Document Type: Article

References (11)

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