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Volumn 48, Issue 14, 2012, Pages 861-863

10dB small-signal graphene FET amplifier

Author keywords

[No Author keywords available]

Indexed keywords

FET AMPLIFIERS; MATCHING INDUCTORS; MAXIMUM GAIN; NOISE MODELLING; POWER GAINS; RETURN LOSS;

EID: 84863697612     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el.2012.1347     Document Type: Article
Times cited : (60)

References (12)
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    • 10.1109/TTHZ.2011.2159558
    • Samoska, L.A.: ' An overview of solid-state integrated circuit amplifiers in the submillimeter-wave and THz regime ', IEEE Trans. Terahertz Sci. Technol., 2011, 1, (1), p. 9-24 10.1109/TTHZ.2011.2159558
    • (2011) IEEE Trans. Terahertz Sci. Technol. , vol.1 , Issue.1 , pp. 9-24
    • Samoska, L.A.1
  • 2
    • 77955231284 scopus 로고    scopus 로고
    • Graphene transistors
    • 10.1038/nnano.2010.89
    • Schwierz, F.: ' Graphene transistors ', Nature Nanotechnol., 2010, 5, (7), p. 487-496 10.1038/nnano.2010.89
    • (2010) Nature Nanotechnol. , vol.5 , Issue.7 , pp. 487-496
    • Schwierz, F.1
  • 3
    • 67349236231 scopus 로고    scopus 로고
    • Graphene frequency multipliers
    • 10.1109/LED.2009.2016443 0741-3106
    • Wang, H., Hsu, A., Wu, J., Kong, J., and Palacios, T.: ' Graphene frequency multipliers ', IEEE Electron Device Lett., 2009, 30, p. 547-549 10.1109/LED.2009.2016443 0741-3106
    • (2009) IEEE Electron Device Lett. , vol.30 , pp. 547-549
    • Wang, H.1    Hsu, A.2    Wu, J.3    Kong, J.4    Palacios, T.5
  • 7
    • 0024738288 scopus 로고
    • Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence
    • 10.1109/22.32217 0018-9480
    • Pospieszalski, M.W.: ' Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence ', IEEE Trans. Microw. Theory Tech., 1989, 37, (9), p. 1340-1350 10.1109/22.32217 0018-9480
    • (1989) IEEE Trans. Microw. Theory Tech. , vol.37 , Issue.9 , pp. 1340-1350
    • Pospieszalski, M.W.1
  • 8
    • 84859210010 scopus 로고    scopus 로고
    • A large signal graphene FET model
    • 10.1109/TED.2012.2182675 0018-9383
    • Habibpour, O., Vukusic, J., and Stake, J.: ' A large signal graphene FET model ', IEEE Trans. Electron Devices, 2012, 59, (4), p. 968-975 10.1109/TED.2012.2182675 0018-9383
    • (2012) IEEE Trans. Electron Devices , vol.59 , Issue.4 , pp. 968-975
    • Habibpour, O.1    Vukusic, J.2    Stake, J.3
  • 10
    • 77956607451 scopus 로고    scopus 로고
    • Noise figure measurement accuracy - The Y-Factor method
    • 'Noise figure measurement accuracy - the Y-Factor method,' Agilent Application Note, 57-2
    • Agilent Application Note , pp. 57-62
  • 11
    • 0032205404 scopus 로고    scopus 로고
    • A new extraction method for the two-parameter FET temperature noise model
    • 10.1109/22.734558 0018-9480
    • Garcia, M., Stenarson, J., Yhland, K., Zirath, H., and Angelov, I.: ' A new extraction method for the two-parameter FET temperature noise model ', IEEE Trans. Microw. Theory Tech., 1998, 46, (11), p. 1679-1685 10.1109/22.734558 0018-9480
    • (1998) IEEE Trans. Microw. Theory Tech. , vol.46 , Issue.11 , pp. 1679-1685
    • Garcia, M.1    Stenarson, J.2    Yhland, K.3    Zirath, H.4    Angelov, I.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.