Roughness parameters for standard description of surface nanoarchitecture

Scanning

Volumn 34, Issue 4, 2012, Pages 257-263

  Webb, Hayden K ^a   Truong, Vi Khanh ^a   Hasan, Jafar ^a   Fluke, Christopher ^a   Crawford, Russell J ^a   Ivanova, Elena P ^a  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

metal coating; nanoarchitecture; roughness; thin films; topography

Indexed keywords

DESCRIPTORS; HORIZONTAL SURFACES; METALLIC THIN FILMS; NANO SCALE; NANO-ARCHITECTURE; ROUGHNESS PARAMETERS; SILVER FILM; STATISTICAL PARAMETERS; SURFACE ARCHITECTURES; SURFACE AREA; TITANIUM FILM; TOPOGRAPHICAL ANALYSIS;

ATOMIC FORCE MICROSCOPY; METAL COATINGS; METALLIC FILMS; STATISTICAL METHODS; THIN FILMS; TITANIUM; TOPOGRAPHY;

SURFACE ROUGHNESS;

SILVER; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; FILM; MEASUREMENT; NANOARCHITECTURE; NANOTECHNOLOGY; PRIORITY JOURNAL; STANDARD; STATISTICAL ANALYSIS; SURFACE PROPERTY; SURFACE ROUGHNESS; THICKNESS; TOPOGRAPHY;

EID: 84863537573     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.21002     Document Type: Article

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