Defect structures and hardening mechanisms in high dose helium ion implanted Cu and Cu/Nb multilayer thin films

International Journal of Plasticity

Volumn 32-33, Issue , 2012, Pages 1-16

  Li, N ^a   Nastasi, M ^a   Misra, A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Bubbles; Hardening mechanism; He implantation; Interface

Indexed keywords

BUBBLE PRESSURE; CU FILMS; HARDENING MECHANISM; HARDNESS MEASUREMENT; HE ATOMS; HE BUBBLES; HE IMPLANTATION; HELIUM ION; HIGH DOSE; ION IMPLANT; IRRADIATED MATERIALS; LAYER THICKNESS; LOADED INTERFACES; MECHANICAL BEHAVIOR; MULTI-LAYER THIN FILM; ROOM TEMPERATURE; SINGLE DISLOCATION; STRENGTHENING MECHANISMS; UNIFORM DISPERSIONS;

BUBBLES (IN FLUIDS); DENTAL ALLOYS; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; HARDENING; HELIUM; INTERFACES (MATERIALS); POINT DEFECTS;

MULTILAYERS;

EID: 84863405861     PISSN: 07496419     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijplas.2011.12.007     Document Type: Article

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