Size dependent strengthening mechanisms in sputtered Fe/W multilayers

Journal of Applied Physics

Volumn 107, Issue 9, 2010, Pages

  Li, Nan ^a   Yu, K Y ^a   Lee, J ^a   Wang, H ^a   Zhang, X ^a  

^a Department of Electrical and Computer Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODEL; BULK COUNTERPART; FILM HARDNESS; IMAGE FORCE; INTERFACE CONSTRAINTS; KOEHLER; LATTICE DISTORTIONS; LAYER THICKNESS; MAXIMUM STRENGTH; MAXIMUM VALUES; MICROSTRUCTURE ANALYSIS; SIZE DEPENDENT; STRENGTHENING MECHANISMS;

HARDNESS; MATHEMATICAL MODELS; MODELS; MULTILAYERS; STRENGTHENING (METAL); X RAY DIFFRACTION;

COMPUTER SIMULATION;

EID: 79251490697     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3400130     Document Type: Article

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