Size effects in indentation response of thin films at the nanoscale: A molecular dynamics study

International Journal of Plasticity

Volumn 24, Issue 11, 2008, Pages 2016-2031

  Nair, Arun K ^a   Parker, Edward ^a   Gaudreau, Peter ^a   Farkas, Diana ^a   Kriz, Ronald D ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

Dislocations; Grain boundaries; Metallic material; Molecular dynamics

Indexed keywords

AGRICULTURAL PRODUCTS; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); DYNAMICS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC FILMS; MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NICKEL; PLASTIC FILMS; POWDERS; QUANTUM CHEMISTRY; SINGLE CRYSTALS; THICK FILMS; THIN FILMS; VICKERS HARDNESS TESTING;

CONTACT STRESSES; DISLOCATION (MOBILITY); DISLOCATION EMISSIONS; DISLOCATION SOURCES; EMBEDDED-ATOM METHOD (EAM); FILM SURFACES; INDENTATION DEPTHS; INDENTATION RESPONSE; INDENTER; INTER ATOMIC POTENTIAL; LOW ANGLE GRAIN BOUNDARIES; MOLECULAR DYNAMICS SIMULATIONS (MDS); NANO SCALING; SIMPLE MODELING; SIMULATION RESULTS; SINGLE CRYSTAL FILMS (SCF); SIZE EFFECTS;

MOLECULAR BEAM EPITAXY;

EID: 48749103230     PISSN: 07496419     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijplas.2008.01.007     Document Type: Article

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