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Volumn 12, Issue 4, 2012, Pages 3696-3700
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Al 2O 3/TiO 2 multilayer passivation layers grown at low temperature for flexible organic devices
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Author keywords
Activation energy; Atomic layer deposition (ALD); Packing density; Passivation layer; Water vapor transmission rate (WVTR)
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Indexed keywords
ALUMINUM OXIDES;
ARRHENIUS-RATE EQUATIONS;
DEPOSITION TEMPERATURES;
LOW TEMPERATURES;
LOW WATER;
ORGANIC DEVICES;
PACKING DENSITY;
PASSIVATION BARRIER;
PASSIVATION LAYER;
PASSIVATION STRUCTURE;
PLASMA POWER;
POLYETHER SULFONE;
TIO;
WATER VAPOR TRANSMISSION;
WATER VAPOR TRANSMISSION RATE;
ACTIVATION ENERGY;
ALUMINUM;
ELECTRON CYCLOTRON RESONANCE;
ETHERS;
PASSIVATION;
REFRACTIVE INDEX;
TITANIUM;
TITANIUM DIOXIDE;
VAPORS;
ATOMIC LAYER DEPOSITION;
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EID: 84863334219
PISSN: 15334880
EISSN: 15334899
Source Type: Journal
DOI: 10.1166/jnn.2012.5663 Document Type: Conference Paper |
Times cited : (16)
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References (9)
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