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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 5, 2004, Pages 2048-2051

Relationship between optical properties and microstructure of CeO 2-SiO2 composite thin films

(6) Koo, Won Hoe a Jeong, Soon Moon a Choi, Sang Hun a Baik, Hong Koo a Lee, Se Jong b Lee, Sung Man c

a Yonsei University (South Korea)

b Kyungsung University (South Korea)

c Kangwon National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; ELECTRON BEAMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

END-HALL ION SOURCE; ION ENERGY; PACKING DENSITY; REFLECTANCE SPECTRA;

THIN FILMS;

EID: 8344280326 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.1782638 Document Type: Article

Times cited : (12)

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