Surface-dependent chemical properties of silicon nanowires: The acceleration of copper oxidation

Applied Physics Letters

Volumn 100, Issue 9, 2012, Pages

  Liao, Fan ^a   Liu, Shanshan ^a   Shao, Mingwang ^a   Lee, Shuit Tong ^b  

^a SOOCHOW UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER OXIDATION; ENHANCEMENT FACTOR; OXIDATION RATES; SEMI-QUANTITATIVE ANALYSIS; SILICON NANOWIRES;

CHEMICAL PROPERTIES; COPPER; NANOWIRES; X RAY DIFFRACTION;

OXIDATION;

EID: 84863247950     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3691943     Document Type: Article

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