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Volumn 82, Issue , 2012, Pages 184-187

Electrical resistance at carbon nanotube/copper interfaces: Capped versus open-end carbon nanotubes

Author keywords

Carbon nanotube; Density of states; Electrical resistance; Interface; Mulliken population

Indexed keywords

CARBON ATOMS; DENSITY OF STATE; ELECTRICAL RESISTANCES; INTERFACIAL BOND STRENGTH; INTERFACIAL CONTACT; MULLIKEN POPULATIONS;

EID: 84863095791     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.05.095     Document Type: Article
Times cited : (13)

References (21)
  • 10
    • 0005311621 scopus 로고    scopus 로고
    • S. Han, and J. Ihm Phys Rev B 61 15 2000 9986 9989
    • (2000) Phys Rev B , vol.61 , Issue.15 , pp. 9986-9989
    • Han, S.1    Ihm, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.