-
1
-
-
0342819025
-
-
0028-0836,. 10.1038/354056a0
-
S. Iijima, Nature (London) 0028-0836 354, 56 (1991). 10.1038/354056a0
-
(1991)
Nature (London)
, vol.354
, pp. 56
-
-
Iijima, S.1
-
2
-
-
0034617249
-
Carbon nanotube-based nonvolatile random access memory for molecular computing
-
DOI 10.1126/science.289.5476.94
-
T. Rueckes, K. Kim, E. Joselevich, G. Y. Tseng, C. L. Cheung, and C. M. Lieber, Science 0036-8075 289, 94 (2000). 10.1126/science.289.5476.94 (Pubitemid 30463297)
-
(2000)
Science
, vol.289
, Issue.5476
, pp. 94-97
-
-
Rueckes, T.1
Kim, K.2
Joselevich, E.3
Tseng, G.Y.4
Cheung, C.-L.5
Lieber, C.M.6
-
3
-
-
33746925961
-
The nature of contact between Pd leads and semiconducting carbon nanotubes
-
DOI 10.1021/nl0604311
-
W. G. Zhu and E. Kaxiras, Nano Lett. 1530-6984 6, 1415 (2006). 10.1021/nl0604311 (Pubitemid 44195320)
-
(2006)
Nano Letters
, vol.6
, Issue.7
, pp. 1415-1419
-
-
Zhu, W.1
Kaxiras, E.2
-
4
-
-
0242304444
-
-
0003-6951,. 10.1063/1.1616662
-
S. Dag, O. Gulseren, S. Ciraci, and T. Yildirim, Appl. Phys. Lett. 0003-6951 83, 3180 (2003). 10.1063/1.1616662
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 3180
-
-
Dag, S.1
Gulseren, O.2
Ciraci, S.3
Yildirim, T.4
-
6
-
-
34547236095
-
-
0021-8979,. 10.1063/1.2748716
-
T. Z. Meng, C. -Y. Wang, and S. -Y. Wang, J. Appl. Phys. 0021-8979 102, 013709 (2007). 10.1063/1.2748716
-
(2007)
J. Appl. Phys.
, vol.102
, pp. 013709
-
-
Meng, T.Z.1
Wang, C.-Y.2
Wang, S.-Y.3
-
7
-
-
34547699445
-
Contact resistance properties between nanotubes and various metals from quantum mechanics
-
DOI 10.1021/jp072794a
-
Y. Matsuda, W. -Q. Deng, and W. A. Goddard, J. Phys. Chem. C 1932-7447 111, 11113 (2007). 10.1021/jp072794a (Pubitemid 47218131)
-
(2007)
Journal of Physical Chemistry C
, vol.111
, Issue.29
, pp. 11113-11116
-
-
Matsuda, Y.1
Deng, W.-Q.2
Goddard III, W.A.3
-
8
-
-
49149088588
-
-
1932-7447,. 10.1021/jp8021776
-
Y. Matsuda, W. -Q. Deng, and W. A. Goddard, J. Phys. Chem. C 1932-7447 112, 11042 (2008). 10.1021/jp8021776
-
(2008)
J. Phys. Chem. C
, vol.112
, pp. 11042
-
-
Matsuda, Y.1
Deng, W.-Q.2
Goddard, W.A.3
-
9
-
-
0037965958
-
-
0031-9007,. 10.1103/PhysRevLett.90.106801
-
J. J. Palacios, A. J. Perez-Jimenez, E. Louis, E. SanFabian, and J. A. Verges, Phys. Rev. Lett. 0031-9007 90, 106801 (2003). 10.1103/PhysRevLett.90. 106801
-
(2003)
Phys. Rev. Lett.
, vol.90
, pp. 106801
-
-
Palacios, J.J.1
Perez-Jimenez, A.J.2
Louis, E.3
Sanfabian, E.4
Verges, J.A.5
-
10
-
-
4243720937
-
-
0163-1829,. 10.1103/PhysRevB.63.245407
-
J. Taylor, H. Guo, and J. Wang, Phys. Rev. B 0163-1829 63, 245407 (2001). 10.1103/PhysRevB.63.245407
-
(2001)
Phys. Rev. B
, vol.63
, pp. 245407
-
-
Taylor, J.1
Guo, H.2
Wang, J.3
-
11
-
-
19744382049
-
-
0163-1829,. 10.1103/PhysRevB.70.115408
-
P. Pomorski, C. Roland, and H. Guo, Phys. Rev. B 0163-1829 70, 115408 (2004). 10.1103/PhysRevB.70.115408
-
(2004)
Phys. Rev. B
, vol.70
, pp. 115408
-
-
Pomorski, P.1
Roland, C.2
Guo, H.3
-
13
-
-
33745611460
-
Noncontact electrical metrology of Cu/low-k interconnect for semiconductor production wafers
-
DOI 10.1063/1.2216898
-
V. V. Talanov, A. Scherz, and A. R. Schwartz, Appl. Phys. Lett. 0003-6951 88, 262901 (2006). 10.1063/1.2216898 (Pubitemid 43992959)
-
(2006)
Applied Physics Letters
, vol.88
, Issue.26
, pp. 262901
-
-
Talanov, V.V.1
Scherz, A.2
Schwartz, A.R.3
-
14
-
-
34447323619
-
-
0163-1829,. 10.1103/PhysRevB.76.045412
-
A. N. Andriotis and M. Menon, Phys. Rev. B 0163-1829 76, 045412 (2007). 10.1103/PhysRevB.76.045412
-
(2007)
Phys. Rev. B
, vol.76
, pp. 045412
-
-
Andriotis, A.N.1
Menon, M.2
-
15
-
-
58049090829
-
-
0163-1829,. 10.1103/PhysRevB.78.235415
-
A. N. Andriotis and M. Menon, Phys. Rev. B 0163-1829 78, 235415 (2008). 10.1103/PhysRevB.78.235415
-
(2008)
Phys. Rev. B
, vol.78
, pp. 235415
-
-
Andriotis, A.N.1
Menon, M.2
-
16
-
-
77949765546
-
-
ATK/VNL, 2008.10 version.
-
ATK/VNL, 2008.10 version, www.quantumwise.com.
-
-
-
-
18
-
-
33745296278
-
-
0163-1829,. 10.1103/PhysRevB.73.235419
-
Y. -H. Kim, J. Tahir-Kheli, P. A. Schultz, and W. A. Goddard III, Phys. Rev. B 0163-1829 73, 235419 (2006). 10.1103/PhysRevB.73.235419
-
(2006)
Phys. Rev. B
, vol.73
, pp. 235419
-
-
Kim, Y.-H.1
Tahir-Kheli, J.2
Schultz, P.A.3
Iii, A.G.W.4
|