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Volumn 8, Issue 3, 2012, Pages 385-392

Probing access resistance of solid-state nanopores with a scanning-probe microscope tip

Author keywords

access resistance; current blockage; nanopore resistance; scanning probe microscopy; solid state nanopores

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; SCANNING PROBE MICROSCOPY;

EID: 84863069707     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201101337     Document Type: Article
Times cited : (48)

References (41)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.