Structural and optical study of Ge nanocrystals embedded in Si 3N 4 matrix

Energy Procedia

Volumn 10, Issue , 2011, Pages 20-27

  Lee, S ^a   Huang, S ^a   Conibeer, G ^a   Green, M A ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Disk shaped nanocrystals; Germanium; GIXRD; Raman; TEM

Indexed keywords

ABSORPTION MEASUREMENTS; ANNEALING PROCESS; ANNEALING TEMPERATURES; CONVENTIONAL TUBES; CRYSTALLIZATION PROPERTIES; CRYSTALLIZATION TRANSITIONS; GE CONTENT; GE NANOCRYSTALS; GIXRD; GLANCING INCIDENCE X-RAY DIFFRACTIONS; MATRIX; OPTICAL STUDY; POST ANNEALING; RADIO FREQUENCIES; RAMAN; TEM IMAGES; TRANSMISSION ELECTRON MICROSCOPE; XRD;

ANNEALING; CRYSTALS; NANOCRYSTALS; PHOTOVOLTAIC EFFECTS; RAMAN SPECTROSCOPY; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

GERMANIUM;

EID: 84862909534     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.10.146     Document Type: Conference Paper

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