Reduction of charge injection barrier by 1-nm contact oxide interlayer in organic field effect transistors

Applied Physics Letters

Volumn 100, Issue 1, 2012, Pages

  Darmawan, Peter ^a   Minari, Takeo ^a,b   Kumatani, Akichika ^a   Li, Yun ^a   Liu, Chuan ^a   Tsukagoshi, Kazuhito ^a,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b RIKEN   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE INJECTION BARRIERS; CHARGE INJECTION PROCESS; DEVICE PERFORMANCE; MATERIAL INTERFACES; PHOTOELECTRON YIELD SPECTROSCOPY; ULTRA-THIN;

INTERFACES (MATERIALS);

ORGANIC FIELD EFFECT TRANSISTORS;

EID: 84862907467     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3673842     Document Type: Article

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