SCOPUS 정보 검색 플랫폼

Microelectronic Engineering

Volumn 93, Issue , 2012, Pages 35-38

Top electrode-dependent resistance switching behaviors of ZnO thin films deposited on Pt/Ti/SiO 2/Si substrate

(7) Tang, Ming Hua a Jiang, Bo a Xiao, Yong Guang a Zeng, Zheng Qiu a Wang, Zi Ping a Li, Jian Cheng b He, John c

a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS (China)

b NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY (China)

c Geological Survey of Canada Sidney (Canada)

Author keywords

Resistance switching behavior; Top electrode dependence; ZnO thin films

Indexed keywords

CHEMICAL SOLUTION DEPOSITION METHOD; CURRENT VOLTAGE CURVE; ELECTROCHEMICAL MIGRATION; LEAKAGE MECHANISM; LINEAR FITTING; POLYCRYSTALLINE ZNO; RESISTANCE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; SPACE-CHARGE LIMITED; SWITCHING CHARACTERISTICS; UNIPOLAR SWITCHING; ZNO THIN FILM;

CURVE FITTING; METAL IONS; METALLIC FILMS; OPTICAL FILMS; SILICON; SWITCHING;

ELECTROCHEMICAL ELECTRODES;

EID: 84862778697 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2011.12.003 Document Type: Article

Times cited : (50)

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