High-throughput graphene imaging on arbitrary substrates with widefield raman spectroscopy

ACS Nano

Volumn 6, Issue 1, 2012, Pages 373-380

  Havener, Robin W ^a   Ju, Sang Yong ^b,c   Brown, Lola ^b   Wang, Zenghui ^b   Wojcik, Michal ^b   Ruiz Vargas, Carlos S ^a   Park, Jiwoong ^a,b  

^a School of Chemical and Molecular Engineering   (United States)

^b Department of Molecular Biology and Genetics   (United States)

^c Yonsei University   (South Korea)

Author keywords

grapheme; imaging; Raman; spectroscopy; widefield

Indexed keywords

CARBON MATERIAL; DEFECT DISTRIBUTION; DYNAMIC PROCESS; GRAPHEME; HIGH THROUGHPUT; IMAGING CAPABILITIES; IMAGING MODES; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN; ORDERS OF MAGNITUDE; RAMAN; RAMAN IMAGING; REALTIME IMAGING; SPECTRAL INFORMATION; WIDE-FIELD;

IMAGING TECHNIQUES; OPTICAL MICROSCOPY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTROSCOPY; THROUGHPUT;

GRAPHENE;

NANOMATERIAL; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; CHEMISTRY; MATERIALS TESTING; METHODOLOGY; RAMAN SPECTROMETRY; ULTRASTRUCTURE;

MATERIALS TESTING; NANOSTRUCTURES; SPECTRUM ANALYSIS, RAMAN; TITANIUM;

EID: 84856147946     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2037169     Document Type: Article

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