Band offset of the In 2S 3/indium tin oxide interface measured by X-ray photoelectron spectroscopy

Thin Solid Films

Volumn 520, Issue 18, 2012, Pages 5856-5859

  Menon, M R Rajesh ^a,b   Mancini, A ^a   Kartha, C Sudha ^b   Vijayakumar, K P ^b   Santoni, A ^a  

^a ENEA   (Italy)

^b Department of Physics   (India)

Author keywords

Band offset; Chemical spray pyrolysis; Indium sulfide; Indium tin oxide; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

BAND OFFSETS; CHEMICAL SPRAY PYROLYSIS; CONDUCTION BAND OFFSET; INDIUM TIN OXIDE; OXIDE INTERFACES; VALENCE BAND DISCONTINUITY;

CHEMICAL PROPERTIES; INDIUM; INDIUM COMPOUNDS; INDIUM SULFIDE; PHOTOELECTRONS; SPRAY PYROLYSIS; TIN; TIN OXIDES; X RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84862172976     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.05.012     Document Type: Article

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