Oxygen migration process in the interfaces during bipolar resistance switching behavior of WO 3-x-based nanoionics devices

Applied Physics Letters

Volumn 100, Issue 23, 2012, Pages

  Yang, Rui ^a   Terabe, Kazuya ^a   Tsuruoka, Tohru ^a   Hasegawa, Tsuyoshi ^a   Aono, Masakazu ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM ELECTRODES; NANOIONICS; OXYGEN MIGRATION; OXYGEN-RICH ATMOSPHERES; PT ELECTRODE; RESISTANCE SWITCHING;

OXYGEN; PHOTOELECTRONS; PLATINUM; X RAY PHOTOELECTRON SPECTROSCOPY;

PHASE INTERFACES;

EID: 84862138489     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4726084     Document Type: Article

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