Atom probe tomography of zinc oxide nanowires

Journal of Electronic Materials

Volumn 41, Issue 5, 2012, Pages 801-808

  Dawahre, Nabil ^a   Shen, Gang ^a   Balci, Soner ^a   Baughman, William ^a   Wilbert, David S ^a   Harris, Nick ^a   Butler, Lee ^a   Martens, Rich ^b   Kim, Seongsin Margaret ^a   Kung, Patrick ^a  

^a University of Alabama   (United States)

^b UNIVERSITY OF ALABAMA   (United States)

Author keywords

Atom probe tomography; Nanowires; Nitrogen; ZnO

Indexed keywords

ATOM PROBE TOMOGRAPHY; CHEMICAL COMPOSITIONS; DEVICE APPLICATION; GROWTH PARAMETERS; IN-DEPTH ANALYSIS; NANOSCALE CHARACTERIZATION; NITROGEN IMPURITY; SAPPHIRE SUBSTRATES; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SINGLE-CRYSTALLINE; VOLTAGE PULSE; WELL-ALIGNED; WIDE BAND GAP; ZINC OXIDE (ZNO); ZINC OXIDE NANOWIRES; ZNO; ZNO NANOWIRE ARRAYS; ZNO NANOWIRES;

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL IMPURITIES; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; NITROGEN; RAMAN SPECTROSCOPY; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

NANOWIRES;

EID: 84862126493     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-011-1803-x     Document Type: Article

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