SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 606, Issue 15-16, 2012, Pages 1289-1292

STM/STS investigation of edge structure in epitaxial graphene

(5) Ridene, M a,b Girard, J C a Travers, L a David, C a Ouerghi, A a

a CNRS (France)

b FACULTÉ DES SCIENCES DE TUNIS (Tunisia)

Author keywords

Edge structure; Graphene; SiC

Indexed keywords

1D STRUCTURES; CARBON STRUCTURES; EDGE STRUCTURES; EPITAXIAL GRAPHENE; IN-PLANE STRESS; LOCAL DENSITY OF STATE; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPY; SIC; STEP EDGE; STM/STS;

EPITAXIAL GROWTH; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE;

GRAPHENE;

EID: 84861905732 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2012.04.006 Document Type: Article

Times cited : (27)

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