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Volumn 111, Issue 7, 2012, Pages
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Global and local planarization of surface roughness by chemical vapor deposition of organosilicon polymer for barrier applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ACRYLIC MONOMERS;
BUILDING MATERIALS;
CURING;
FLEXIBLE ELECTRONICS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASTIC COATINGS;
POLYSTYRENES;
SCANNING ELECTRON MICROSCOPY;
SILICON COMPOUNDS;
SUBSTRATES;
SURFACE ROUGHNESS;
ATOMIC FORCE MICROGRAPHS;
BARRIER LAYER DEPOSITION;
CHEMICAL VAPOR DEPOSITIONS (CVD);
CROSS-SECTIONAL SCANNING;
GLOBAL PLANARIZATIONS;
ORGANOSILICON MONOMERS;
ORGANOSILICON POLYMERS;
POLYSTYRENE MICRO-SPHERE;
PLASMA CVD;
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EID: 84861749554
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3702428 Document Type: Conference Paper |
Times cited : (29)
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References (24)
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