Using fixed fiduciary markers for stage drift correction

Optics Express

Volumn 20, Issue 11, 2012, Pages 12177-12183

  Lee, Sang Hak ^a,b   Baday, Murat ^b   Tjioe, Marco ^b   Simonson, Paul D ^a,b   Zhang, Ruobing ^a,b   Cai, En ^a,b   Selvin, Paul R ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE;

AFTER-THE-FACT; CONVENTIONAL EQUIPMENT; DIFFRACTION RINGS; DRIFT CORRECTION; GAUSSIAN FITS; INFRARED LIGHT EMITTING DIODES; INTENSITY MEASUREMENTS; KINESINS; LOW COSTS; NANOMETRICS; OUT-OF-FOCUS; SUPER RESOLUTION; WET SAMPLE;

LIGHT EMITTING DIODES;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; FIDUCIAL MARKER; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; INSTRUMENTATION; NANOTECHNOLOGY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FIDUCIAL MARKERS; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; NANOTECHNOLOGY;

EID: 84861501724     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.012177     Document Type: Article

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