Effect of substrate temperature on the structural and electrical properties of MBE grown ZnO

Key Engineering Materials

Volumn 510-511, Issue 1, 2012, Pages 132-136

  Asghar, M ^a   Mahmood, K ^a   Hasan, M A ^b  

^a THE ISLAMIA UNIVERSITY OF BAHAWALPUR   (Pakistan)

^b Department of Physics and Optical Sciences ^*  (United States)

Author keywords

Carrier concentration; Crystallite size; Substrate temperature; X ray diffraction; ZnO thin films

Indexed keywords

CARRIER CONCENTRATION; CRYSTALLITE SIZE; II-VI SEMICONDUCTORS; METALLIC FILMS; MICROSTRUCTURE; THICK FILMS; THIN FILMS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; ZINC OXIDE;

CRYSTALLINE SIZE; HEXAGONAL STRUCTURES; INTERSTITIALS; MICROSTRUCTURE OF FILMS; STRONG DEPENDENCES; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSTRATE TEMPERATURE; ZNO THIN FILM;

GROWTH RATE;

EID: 84861439468     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.510-511.132     Document Type: Conference Paper

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