Three-dimensional characterization of microstructure by electron back-scatter diffraction

Annual Review of Materials Research

Volumn 37, Issue , 2007, Pages 627-658

  Rollett, Anthony D ^a   Lee, S B ^a   Campman, R ^b   Rohrer, G S ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b UNITED STATES STEEL CORPORATION   (United States)

Author keywords

EBSD; Microscopy; Orientation scanning; Statistical reconstruction; Texture

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS; STATISTICAL METHODS;

ELECTRON BACKSCATTER DIFFRACTION; MULTIPLE CROSS SECTIONS; STATISTICAL RECONSTRUCTION;

MICROSTRUCTURE;

EID: 34848832043     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.37.052506.084401     Document Type: Review

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