Applications of admittance spectroscopy in photovoltaic devices beyond majority-carrier trapping defects

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 000075-000078

  Li, Jian V ^a,b   Crandall, Richard S ^a   Repins, Ingrid L ^a   Nardes, Alexandre M ^a   Levi, Dean H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE MEASUREMENTS; ADMITTANCE SPECTROSCOPIES; CDTE; CU(IN , GA)SE; DATA INTERPRETATION; HETERO INTERFACES; HIT CELLS; MINORITY CARRIER LIFETIMES; NON-OHMIC CONTACTS; ORGANIC PHOTOVOLTAICS; PHOTOVOLTAIC DEVICES; PHOTOVOLTAIC TECHNOLOGY; PHYSICAL MECHANISM; REVERSE BIAS; TRAPPING DEFECTS;

DATA PROCESSING; ELECTRIC ADMITTANCE; ELECTRIC CONTACTORS; OHMIC CONTACTS;

PHOTOVOLTAIC EFFECTS;

EID: 84861023213     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6185849     Document Type: Conference Paper

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