A method to measure resistivity, mobility, and absorber thickness in thin-film solar cells with application to CdTe devices

Solar Energy Materials and Solar Cells

Volumn 94, Issue 12, 2010, Pages 2073-2077

  Li, Jian V ^a   Li, Xiaonan ^a   Albin, David S ^a   Levi, Dean H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Absorber thickness; Admittance spectroscopy; Back contact; Capacitancevoltage; CdTe; Mobility

Indexed keywords

ABSORBER THICKNESS; ADMITTANCE SPECTROSCOPIES; BACK CONTACT; CAPACITANCE VOLTAGE; CDTE; MOBILITY;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; CARRIER CONCENTRATION; COPPER; DIELECTRIC RELAXATION; ELECTRIC ADMITTANCE; SOLAR CELLS;

CARRIER MOBILITY;

EID: 77957676077     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.06.018     Document Type: Article

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