The determination of carrier mobilities in CIGS photovoltaic devices using high-frequency admittance measurements

Thin Solid Films

Volumn 480-481, Issue , 2005, Pages 336-340

  Lee, Jinwoo ^a   Cohen, J David ^a   Shafarman, William N ^b  

^a UNIVERSITY OF OREGON   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

Carrier mobilities; CIGS; High frequency admittance measurements

Indexed keywords

CARRIER MOBILITY; DIELECTRIC MATERIALS; HALL EFFECT; HYDROGENATION; NATURAL FREQUENCIES; POLYCRYSTALLINE MATERIALS; SCHOTTKY BARRIER DIODES; SOLAR CELLS; THERMAL EFFECTS; THIN FILMS;

CIGS; COPLANAR CONTACTS; HIGH-FREQUENCY ADMITTANCE MEASUREMENTS; HOLE MOBILITIES;

COPPER COMPOUNDS;

EID: 18444388296     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.087     Document Type: Conference Paper

References (11)

1. N.G. Dhere, M.C. Lourenco, R.G. Dhere, and L.L. Kazmerski Sol. Cells 16 1986 369
2. Y. Yamaguchi, Y. Yamamoto, T. Tanaka, Y. Demizu, and A. Yoshida Jpn. J. Appl. Phys. 35 1996 L1618
3. D.J. Schröder, J.L. Hernandez, G.D. Berry, and A.A. Rockett J. Appl. Phys. 83 1998 1519
4. S. Siebentritt, A. Bauknecht, A. Gerhard, and U. Fiedeler Sol. Energy Mater. Sol. Cells 67 2001 129
5. D.V. Lang, J.D. Cohen, and J.P. Harbison Phys. Rev., B 25 1982 5285
6. J.T. Heath, J.D. Cohen, and W.N. Shafarman J. Appl. Phys. 95 2004 1000
7. See for example T. Walter, R. Herberholtz, C. Müller, and H.W. Schock J. Appl. Phys. 80 1996 4411
8. W.N. Shafarman, R. Klenk, and B.E. McCandless J. Appl. Phys. 79 1996 7324
9. W.N. Shafarman, and J. Zhu Mater. Res. Soc. Symp. Proc. 668 2001 H2.3
10. M. Igalson, and H.W. Schock J. Appl. Phys. 80 1996 5765
11. U. Rau, M. Schmitt, J. Parisis, W. Riedl, and F. Karg Appl. Phys. Lett. 73 1998 223