Investigation of native oxide growth on zinc in different atmospheres by spectroscopic ellipsometry

Physica Status Solidi (A) Applications and Materials Science

Volumn 209, Issue 5, 2012, Pages 846-853

  Chen, Ying ^a,b   Schneider, Paul ^a   Erbe, Andreas ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

atmospheric corrosion; atmospheric oxidation; electronic structure; ZnO

Indexed keywords

ATMOSPHERIC OXIDATION; EX SITU; IN-SITU; LAYER THICKNESS; NATIVE OXIDE GROWTH; NATIVE OXIDE LAYER; OPTICAL CELLS; SECOND PHASE; XPS ANALYSIS; ZNO;

ATMOSPHERIC CORROSION; ELECTRONIC STRUCTURE; GROWTH KINETICS; OXIDE FILMS; PHOTOELECTRONS; SPECTROSCOPIC ELLIPSOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

METALLIC COMPOUNDS;

EID: 84860651267     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201100542     Document Type: Article

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