Optical constants and band edge of amorphous zinc oxide thin films

Thin Solid Films

Volumn 515, Issue 18, 2007, Pages 7393-7399

  Khoshman, Jebreel M ^a   Kordesch, Martin E ^b  

^a AL HUSSEIN BIN TALAL UNIVERSITY   (Jordan)

^b OHIO UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; FILM GROWTH; MAGNETRON SPUTTERING; OPTICAL CONSTANTS; REFRACTIVE INDEX; THIN FILMS; X RAY DIFFRACTION;

BREWSTER ANGLES; ELLIPSOMETRIC SPECTRA; NEAR INFRARED REGIONS; POLARIZED OPTICAL PROPERTIES;

ZINC OXIDE;

EID: 34249053491     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.055     Document Type: Article

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