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Volumn 32, Issue 10, 2012, Pages 2423-2430
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Effects of Ta 5+ doping on microstructure evolution, dielectric properties and electrical response in CaCu 3Ti 4O 12 ceramics
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Author keywords
Capacitors; Dielectric properties; Electrical properties; Grain boundaries; Grain growth
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Indexed keywords
CAPACITOR MODELS;
CHARGE COMPENSATION;
DC CONDUCTIVITY;
DIELECTRIC CONSTANT VALUES;
ELECTRICAL RESPONSE;
EXPERIMENTAL DATA;
GRAIN BOUNDARY RESISTANCE;
GRAIN-BOUNDARY MOBILITY;
INTERNAL BARRIERS;
INTRINSIC ELECTRICAL PROPERTY;
LOSS TANGENT;
MEAN-GRAIN SIZE;
MICROSTRUCTURE EVOLUTIONS;
POTENTIAL BARRIER HEIGHT;
SPACE CHARGE POLARIZATION;
CAPACITORS;
CERAMIC MATERIALS;
DIELECTRIC PROPERTIES;
GRAIN BOUNDARIES;
GRAIN GROWTH;
MICROSTRUCTURE;
PERMITTIVITY;
ELECTRIC PROPERTIES;
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EID: 84860568956
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2012.02.048 Document Type: Article |
Times cited : (118)
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References (41)
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