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Journal of Alloys and Compounds

Volumn 511, Issue 1, 2012, Pages 90-94

Microstructures and electrical responses of pure and chromium-doped CaCu3Ti4O12 ceramics

(3) Zheng, Qian a Fan, Huiqing a Long, Changbai a

a NORTHWESTERN POLYTECHNICAL UNIVERSITY (China)

Author keywords

CCTO ceramics; Electronic properties; Grain boundaries; Microstructure

Indexed keywords

CCTO CERAMICS; CHROMIUM DOPING; COMPLEX PERMITTIVITY; CRYSTALLINE PHASE; DC CONDUCTIVITY; ELECTRIC MODULUS; ELECTRIC MODULUS FORMALISM; ELECTRICAL DATA; ELECTRICAL RELAXATIONS; ELECTRICAL RESPONSE; IMPEDANCE SPECTRUM; SOLID STATE REACTION METHOD; TEMPERATURE RANGE; X-RAY DIFFRACTION STUDIES;

ACTIVATION ENERGY; CERAMIC MATERIALS; CHROMIUM; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC PROPERTIES; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; OXYGEN; OXYGEN VACANCIES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 80054715191 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2011.09.002 Document Type: Article

Times cited : (106)

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