Optimised antireflection coatings using silicon nitride on textured silicon surfaces based on measurements and multidimensional modelling

Energy Procedia

Volumn 15, Issue , 2012, Pages 78-83

  Duttagupta, Shubham ^a   Ma, Fajun ^a   Hoex, Bram ^a   Mueller, Thomas ^a   Aberle, Armin G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

2D modelling; Antireflection coatings; Optical properties; Silicon nitride; Silicon wafer solar cells

Indexed keywords

2D MODELLING; ABSORPTION LOSS; AS-DEPOSITED STATE; BULK PASSIVATION; CRYSTALLINE SILICON SURFACES; IN-LINE; LOSS MECHANISMS; MONO-SI WAFER; MULTIDIMENSIONAL MODELLING; OPTICAL REFLECTION; SATURATION CURRENT DENSITIES; SILICON NITRIDE FILM; SILICON SURFACES; SINX FILMS; SURFACE PASSIVATION; TEXTURED SI; TEXTURED SILICON WAFERS; WEIGHTED AVERAGES;

ANTIREFLECTION COATINGS; COATINGS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SILICON; SILICON NITRIDE; STATISTICAL METHODS;

SILICON WAFERS;

EID: 84860540566     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2012.02.009     Document Type: Conference Paper

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