Structural and optical characterization of two-dimensional arrays of Si nanocrystals embedded in SiO 2 for photovoltaic applications

Journal of Applied Physics

Volumn 111, Issue 8, 2012, Pages

  Gardelis, S ^a   Nassiopoulou, A G ^a   Manousiadis, P ^a   Milita, Silvia ^b   Gkanatsiou, A ^c   Frangis, N ^c   Lioutas, Ch B ^c  

^a INSTITUTE OF MICROELECTRONICS   (Greece)

^b CNR   (Italy)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; GRAZING INCIDENCE X-RAY DIFFRACTION; GROWTH DIRECTIONS; HIGH-RESOLUTION TEM; LATERAL SIZES; MULTI-LAYERED STRUCTURE; NARROW SIZE DISTRIBUTIONS; OPTICAL CHARACTERIZATION; OPTICAL MEASUREMENT; PHOTOGENERATED CARRIERS; PHOTOVOLTAIC APPLICATIONS; POLYCRYSTALLINE; QUANTUM SIZE EFFECTS; RADIATIVE RECOMBINATION; ROOM TEMPERATURE; SI NANOCRYSTAL; SILICON NANOCRYSTALS; STRUCTURAL CHARACTERIZATION; THERMAL OXIDATION; TOP SURFACE; TRANSMISSION ELECTRON MICROSCOPY (TEM); TUNNEL BARRIER; TWO-DIMENSIONAL ARRAYS; VERTICAL SIZE; X RAY REFLECTIVITY; XRD;

ENERGY GAP; FILM GROWTH; GRAIN BOUNDARIES; OPTICAL DATA PROCESSING; OXIDATION; PHOTOVOLTAIC EFFECTS; QUARTZ; SEPARATION; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL; X RAY DIFFRACTION;

SILICON;

EID: 84860528169     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4707939     Document Type: Article

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