Evidence of quantum size effect in nanocrystalline silicon by optical absorption

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 19, 2001, Pages 1953221-1953225

  Matsumoto, Takahiro ^a   Suzuki, Jun Ichi ^b   Ohnuma, Masato ^c   Kanemitsu, Yoshihiko ^d   Masumoto, Yasuaki ^a,e  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^e UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CRYSTAL; LIGHT ABSORPTION; PARTICLE SIZE; QUANTUM MECHANICS; REFLECTOMETRY; SEMICONDUCTOR; X RAY CRYSTALLOGRAPHY;

EID: 0034907663     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/physrevb.63.195322     Document Type: Article

References (22)