Conductivity mechanism of nanosized silver layer embedded in indium zinc oxide

Journal of Applied Physics

Volumn 111, Issue 8, 2012, Pages

  Sun, Jian ^a   Lai, Weng Soon ^a   Gong, Hao ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AG THICKNESS; CONDUCTION MODELS; CONDUCTIVITY MECHANISMS; CRITICAL THICKNESS; EXPERIMENTAL DATA; FIGURE OF MERITS; INDIUM ZINC OXIDES; IZO-AG-IZO; METALLIC CONDUCTION; NANO-SIZED; SEMICONDUCTOR BEHAVIOR; SILVER LAYER;

PHYSICAL PROPERTIES; PHYSICS;

SILVER;

EID: 84860507082     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4704686     Document Type: Article

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