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Volumn 269, Issue 19, 2011, Pages 2075-2079
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Thermal spike analysis of ion-induced tracks in semiconductors
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Author keywords
Coulomb explosion; Semiconductors; Swift ions; Thermal spike; Tracks; Velocity effect
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Indexed keywords
COULOMB EXPLOSION;
SWIFT IONS;
THERMAL SPIKES;
TRACKS;
VELOCITY EFFECT;
DIELECTRIC DEVICES;
EXPLOSIONS;
IONS;
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EID: 84860390444
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2011.06.014 Document Type: Article |
Times cited : (24)
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References (28)
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