Contactless microwave measurements of photoconductivity in silicon hyperdoped with chalcogens

Applied Physics Express

Volumn 5, Issue 4, 2012, Pages

  Recht, Daniel ^a   Hutchinson, David ^b   Cruson, Thomas ^b   DiFranzo, Anthony ^b   McAllister, Andrew ^b   Said, Aurore J ^a   Warrender, Jeffrey M ^c   Persans, Peter D ^b   Aziz, Michael J ^a  

^a HARVARD UNIVERSITY   (United States)

^b Rensselaer Polytechnic Institute   (United States)

^c Benet Laboratories   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENS; CONTACT LESS; INSULATOR-TO-METAL TRANSITIONS; MICROWAVE REFLECTIVITY; P-TYPE SILICON; PHOTOCARRIER LIFETIMES; PHOTOINDUCED CHANGE;

SELENIUM; SULFUR;

PHOTOCONDUCTIVITY;

EID: 84860129998     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.5.041301     Document Type: Article

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