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Applied Physics Letters

Volumn 100, Issue 16, 2012, Pages

Experimental confirmation of temperature dependent negative capacitance in ferroelectric field effect transistor

(3) Salvatore, Giovanni A a Rusu, Alexandru a Ionescu, Adrian M a

a EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COUNTER-CLOCKWISE; DESIGN CONDITION; ELECTRICAL FIELD; EXPERIMENTAL CONFIRMATION; FERROELECTRIC FIELD EFFECT TRANSISTORS; INTERNAL VOLTAGE; NEGATIVE CAPACITANCE; OPTIMUM TEMPERATURE; S SHAPE; SUBTHRESHOLD SWING; TEMPERATURE DEPENDENT;

AMPLIFICATION; CAPACITANCE; MESFET DEVICES; MIS DEVICES;

FERROELECTRICITY;

EID: 84860006062 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4704179 Document Type: Article

Times cited : (89)

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