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Volumn 12, Issue 5, 2012, Pages 1442-1449

Love wave characterization of the shear modulus variations of mesoporous sensitive films during vapor sorption

Author keywords

Gas sensors; sensor applications; shear modulus measurement; surface acoustic waves; thin film testing

Indexed keywords

ANOMALOUS RESPONSE; ELASTIC SHEAR MODULUS; ELLIPSOMETRIC POROSIMETRY; HIGH HUMIDITY; HUMIDITY EXPOSURES; INITIAL VALUES; LOVE WAVE; MECHANICAL BEHAVIOR; MESOPOROUS; MESOPOROUS TITANIA; MODULUS MEASUREMENTS; MULTI-LAYERED; SENSITIVE FILMS; SENSOR APPLICATIONS; SHEAR MODULUS VARIATION; SURFACE ACOUSTIC WAVES; THICKNESS OF THE FILM; VAPOR SORPTION; VELOCITY SHIFT; WATER SORPTION;

EID: 84859884888     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2011.2173189     Document Type: Article
Times cited : (21)

References (26)
  • 1
    • 9144228845 scopus 로고    scopus 로고
    • Advanced selective optical sensors based on periodically organized mesoporous hybrid silica thin films
    • DOI 10.1039/b408869g
    • L. Nicole, C. Boissière, D. Grosso, P. Hesemann, J. Moreau, and C. Sanchez, "Advanced selective optical sensors based on periodically organized mesoporous hybrid silica thin films," Chemical Communications, pp. 2312-2313, 2004. (Pubitemid 39545906)
    • (2004) Chemical Communications , Issue.20 , pp. 2312-2313
    • Nicole, L.1    Boissiere, C.2    Grosso, D.3    Hesemann, P.4    Moreau, J.5    Sanchez, C.6
  • 5
    • 0036647652 scopus 로고    scopus 로고
    • Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics
    • DOI 10.1016/S0040-6090(02)00430-3, PII S0040609002004303
    • G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, and L. Verdini, "Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics," Thin Solid Films, vol. 414, pp. 99-104, 2002. (Pubitemid 34863002)
    • (2002) Thin Solid Films , vol.414 , Issue.1 , pp. 99-104
    • Carlotti, G.1    Colpani, P.2    Piccolo, D.3    Santucci, S.4    Senez, V.5    Socino, G.6    Verdini, L.7
  • 6
    • 0036897565 scopus 로고    scopus 로고
    • Determination of Young's modulus of porous low-k films by ellipsometric porosimetry
    • DOI 10.1149/1.1517771
    • K. P. Mogilnikov and M. R. Baklanov, "Determination of Young's modulus of porous low-fc films by ellipsometric porosimetry," Electrochemical and Solid-State Lett., vol. 5, pp. F29-F31, 2002. (Pubitemid 35427621)
    • (2002) Electrochemical and Solid-State Letters , vol.5 , Issue.12
    • Mogilnikov, K.P.1    Baklanov, M.R.2
  • 7
    • 79956054897 scopus 로고    scopus 로고
    • Critical properties of nanoporous low dielectric constant films revealed by Brillouin light scattering and surface acoustic wave spectroscopy
    • C. M. Flannery, T. Wittkowski, K. Jung, B. Hillebrands, and M. R. Baklanov, "Critical properties of nanoporous low dielectric constant films revealed by Brillouin light scattering and surface acoustic wave spectroscopy," Appl. Phys. Lett., vol. 80, pp. 4594-4596, 2002.
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 4594-4596
    • Flannery, C.M.1    Wittkowski, T.2    Jung, K.3    Hillebrands, B.4    Baklanov, M.R.5
  • 9
    • 0035281704 scopus 로고    scopus 로고
    • Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry
    • DOI 10.1016/S0169-4332(00)00847-3
    • C. Wongmanerod, S. Zangooie, and H. Arwin, "Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry," Appl. Surf. Sci., vol. 172, pp. 117-125, 2001. (Pubitemid 32196428)
    • (2001) Applied Surface Science , vol.172 , Issue.1-2 , pp. 117-125
    • Wongmanerod, C.1    Zangooie, S.2    Arwin, H.3
  • 11
    • 29844442490 scopus 로고    scopus 로고
    • Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry
    • DOI 10.1021/la050981z
    • C. Boissiere, D. Grosso, S. Lepoutre, L. Nicole, A. Brunet-Bruneau, and C. Sanchez, "Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry," Lang-muir, vol. 21, pp. 12362-12371, 2005. (Pubitemid 43037205)
    • (2005) Langmuir , vol.21 , Issue.26 , pp. 12362-12371
    • Boissiere, C.1    Grosso, D.2    Lepoutre, S.3    Nicole, L.4    Bruneau, A.B.5    Sanchez, C.6
  • 12
    • 0035369913 scopus 로고    scopus 로고
    • A love-wave gas sensor coated with functionalized polysiloxane for sensing organophosphorus compounds
    • DOI 10.1016/S0925-4005(01)00578-0, PII S0925400501005780
    • C. Zimmermann, D. Rebière, C. Dejous, J. Pistré, E. Chastaing, and R. Planade, "A Love-wave gas sensor coated with functionalized polysiloxane for sensing organophosphorus compounds," Sens. Actuators B, vol. 76, pp. 86-94, 2001. (Pubitemid 32513864)
    • (2001) Sensors and Actuators, B: Chemical , vol.76 , Issue.1-3 , pp. 86-94
    • Zimmermann, C.1    Rebiere, D.2    Dejous, C.3    Pistre, J.4    Chastaing, E.5    Planade, R.6
  • 13
    • 40049111883 scopus 로고    scopus 로고
    • Design, synthesis, and properties of inorganic and hybrid thin films having periodically organized nanoporosity
    • DOI 10.1021/cm702100t
    • C. Sanchez, C. Boissiere, D. Grosso, C. Laberty, and L. Nicole, "Design, synthesis and properties of inorganic and hybrid thin films having periodically organized nanoporosity," Chem. Mater., vol. 20, no. 3, pp. 682-737, 2008. (Pubitemid 351320467)
    • (2008) Chemistry of Materials , vol.20 , Issue.3 , pp. 682-737
    • Sanchez, C.1    Boissiere, C.2    Grosso, D.3    Laberty, C.4    Nicole, L.5
  • 16
    • 0031094297 scopus 로고    scopus 로고
    • Elastic properties of silicon dioxide films deposited by chemical vapour deposition from tetraethylorthosilicate
    • PII S0040609096093467
    • G. Carlotti, L. Doucet, and M. Dupeux, "Elastic properties of silicon dioxide films deposited by chemical vapour deposition from tetraethy-lorthosilicate," Thin Solid Films, vol. 296, pp. 102-105, 1997. (Pubitemid 127368530)
    • (1997) Thin Solid Films , vol.296 , Issue.1-2 , pp. 102-105
    • Carlotti, G.1    Doucet, L.2    Dupeux, M.3
  • 17
    • 0025519596 scopus 로고
    • Matrix methods applied to acoustic waves in multilayers
    • E. L. Adler, "Matrix methods applied to acoustic waves in multilayers," IEEE Trans. UFFC, vol. 37, pp. 485-490, 1990.
    • (1990) IEEE Trans. UFFC , vol.37 , pp. 485-490
    • Adler, E.L.1
  • 18
    • 21644487195 scopus 로고    scopus 로고
    • Propagation of surface acoustic waves in anisotropic piezoelectric multilayers: Transfer matrix formalism
    • H. Kim, "Propagation of surface acoustic waves in anisotropic piezoelectric multilayers: Transfer matrix formalism," Korean Phys. Soc, vol. 10, pp. 125-132, 1997.
    • (1997) Korean Phys. Soc , vol.10 , pp. 125-132
    • Kim, H.1
  • 21
    • 0000285027 scopus 로고
    • The electrical conductivity of binary disordered systems, percolation cluster, fractals and related models
    • J. P. Clerc, G. Giraud, J. M. Laugier, and J. M. Luck, "The electrical conductivity of binary disordered systems, percolation cluster, fractals and related models," Advances in Physics, vol. 39, pp. 191-309, 1990.
    • (1990) Advances in Physics , vol.39 , pp. 191-309
    • Clerc, J.P.1    Giraud, G.2    Laugier, J.M.3    Luck, J.M.4
  • 23
    • 0042942272 scopus 로고    scopus 로고
    • Viscosity sensing using a Love-wave device
    • PII S092442479800017X
    • B. Jakoby and M. J. Vellekoop, "Viscosity sensing using a Love wave device," Sens. Actuators A, vol. 68, pp. 275-281, 1998. (Pubitemid 128399769)
    • (1998) Sensors and Actuators, A: Physical , vol.68 , Issue.1-3 , pp. 275-281
    • Jakoby, B.1    Vellekoop, M.J.2
  • 25
    • 84939775172 scopus 로고
    • Reporting physisorption data for gas/solid systems with special reference to the determination of surface area and porosity
    • K. S. W. Sing, D. H. Everett, R. A. W. Haul, L. Moscou, R. A. Pierotti, J. Rouquerol, and T. Siemieniewska, "Reporting physisorption data for gas/solid systems with special reference to the determination of surface area and porosity," Pure & Appl. Chem., vol. 57, no. 4, pp. 603-619, 1985.
    • (1985) Pure & Appl. Chem. , vol.57 , Issue.4 , pp. 603-619
    • Sing, K.S.W.1    Everett, D.H.2    Haul, R.A.W.3    Moscou, L.4    Pierotti, R.A.5    Rouquerol, J.6    Siemieniewska, T.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.